Your quest for integrated circuit inspection starts and ends with Nisene Technology Group, the world leader in counterfeit detection. With our available lineup of products designed for deeper-level sample processing — in particular, affording our end users with the most desire goal: visual inspection of the die surface — Nisene has every chip distributor’s needs covered.
The JetEtch family of decapsulation systems by Nisene Technology Group is the most widely used decap system for failure analysis and counterfeit detection. The biggest players in these major industries use Nisene product in all of their labs, including United States and abroad. Anywhere on Earth that decap is performed, a Nisene decap system is there. Have a look at our testimonials page to read just a few examples of satisfied customers from various industries.
Nisene is also a main contributor to SAE AS6081 and SAE AS6171 counterfeit detection standards! We have published work with the following programs (among others):
a. Components Technology Institute (CTI)
b. ERAI
c. SMTA
d. ISTFA
e. CHASE/UCONN
f. IDEA
g. SAE
h. and many more
By providing access to the surface of the die for complete visual inspection, the decapsulation process enables the most comprehensive form of testing available. X-ray, lead testing, and other inspection technologies and gimmicks only tell part of the story. Have a look at some samples below.
These results are possible only with decapsulation technology!
A Polymatech Company
Nisene Technology Group is the world leader in automated decapsulation. We’ve been doing this since the 1970s, back in the days of the original Jet Etch decapsulation system — the very first automated IC decapsulation system. Now with advanced Microwave Induced Plasma for IC decapsulation.
